tccgen.c:
  doubles need to be aligned, on ARM.  The section_reserve()
  in init_putv does not do that.
-D ONE_SOURCE: is now the default and not longer needed. Also,
  tcc.h now sets the default native target.  These both make
  compiling tcc simple as "gcc tcc.c -o tcc -ldl" again.
arm-asm.c:
  enable pseudo asm also for inline asm
tests/tests2/Makefile:
  disable bitfield tests except on windows and x86_64
  and don't generate-always
tcc.c:
  fix a loop with -dt on errors
configure:
  print compiler version (as recognized)
tccpp.c:
  actually define symbols for tcc -dt
  clear static variables (needed for -dt or libtcc usage)
96_nodata_wanted.c:
  use __label__ instead of asm
lib/files:
  use native symbols (__i386__ etc.) instead of TCC_TARGET_...

The existing variable 'nocode_wanted' is now used to control
output of static data too. So...

(nocode_wanted == 0)
    code and data (normal within functions)
(nocode_wanted < 0)
    means: no code, but data (global or static data)
(nocode_wanted > 0)
    means: no code and no data (code and data suppressed)
(nocode_wanted & 0xC0000000)
    means:  we're in declaration of static data

Also: new option '-dT' to be used with -run
    tcc -dT -run file.c
This will look in file.c for certain comment-boundaries:
    /*-* test-xxx: ...some description */
and then for each test below run it from memory.  This way
various features and error messages can be tested with one
single file.  See 96_nodata_wanted.c for an example.

Also: tccgen.c: one more bitfield fix

tccpp.c:
* #pragma comment(option,"-some-option")
  to set commandline option from C code.  May work only
  for some options.
libtcc.c:
* option "-d1..9": sets a 'g_debug' global variable.
  (for development)
tests2/Makefile:
* new make targets: tests2.37 / tests2.37+
  run single test from tests2,  optionally update .expect
* new variable GEN-ALWAYS to always generate certain .expects
* bitfields test
tccgen.c:
* bitfields: fix a bug and improve slightly more
* _Generic: ignore "type match twice"